![SMART HDD ステータス出力の解釈 - ご協力をお願いします](https://rvso.com/image/1557238/SMART%20HDD%20%E3%82%B9%E3%83%86%E3%83%BC%E3%82%BF%E3%82%B9%E5%87%BA%E5%8A%9B%E3%81%AE%E8%A7%A3%E9%87%88%20-%20%E3%81%94%E5%8D%94%E5%8A%9B%E3%82%92%E3%81%8A%E9%A1%98%E3%81%84%E3%81%97%E3%81%BE%E3%81%99%20.png)
これは、Ubuntu システムでマウント エラーが発生したディスクです。fstab の設定が間違っているのか、実際のハードウェア エラーなのかはわかりません。smartctl を実行してディスクの状態を確認しました。結果の読み取り経験はありませんが、このディスクには重大な問題があるように見えます。しかし、ディスクを購入したショップのスタッフは、ディスクは問題ないと言っています。ディスクの実際の状態と SMART の結果の重要性について、何かヒントをくれる人はいませんか?
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-22-generic] (local
build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 3.5" DT01ABA... Desktop HDD
Device Model: TOSHIBA DT01ABA300
Serial Number: XXXXXXXXXXXXX
LU WWN Device Id: 5 000039 ff4c8910e
Firmware Version: MZ6OABB0
User Capacity: 3.000.592.982.016 bytes [3,00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 5940 rpm
Form Factor: 3.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 4
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is: Thu Jun 2 15:48:48 2016 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 121) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: (28357) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 473) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 078 078 016 Pre-fail Always - 61472768
2 Throughput_Performance 0x0005 142 142 054 Pre-fail Offline - 90
3 Spin_Up_Time 0x0007 146 146 024 Pre-fail Always - 390 (Average 362)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 281
5 Reallocated_Sector_Ct 0x0033 001 001 005 Pre-fail Always FAILING_NOW 642
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 138 138 020 Pre-fail Offline - 33
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 291
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 274
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 375
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 375
194 Temperature_Celsius 0x0002 181 181 000 Old_age Always - 33 (Min/Max 17/53)
196 Reallocated_Event_Count 0x0032 074 074 000 Old_age Always - 648
197 Current_Pending_Sector 0x0022 001 001 000 Old_age Always - 25960
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 66
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 8252 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 8252 occurred at disk power-on lifetime: 146 hours (6 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 1c aa 00 Error: UNC 8 sectors at LBA = 0x00aa1ce8 = 11148520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 08 e8 1c aa e0 00 3d+05:57:06.926 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:57:02.420 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:57.914 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:53.407 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:48.901 READ DMA EXT
Error 8251 occurred at disk power-on lifetime: 146 hours (6 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 1c aa 00 Error: UNC 8 sectors at LBA = 0x00aa1ce8 = 11148520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 08 e8 1c aa e0 00 3d+05:57:02.420 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:57.914 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:53.407 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:48.901 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:44.397 READ DMA EXT
Error 8250 occurred at disk power-on lifetime: 146 hours (6 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 1c aa 00 Error: UNC 8 sectors at LBA = 0x00aa1ce8 = 11148520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 08 e8 1c aa e0 00 3d+05:56:57.914 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:53.407 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:48.901 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:44.397 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:39.897 READ DMA EXT
Error 8249 occurred at disk power-on lifetime: 146 hours (6 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 1c aa 00 Error: UNC 8 sectors at LBA = 0x00aa1ce8 = 11148520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 08 e8 1c aa e0 00 3d+05:56:53.407 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:48.901 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:44.397 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:39.897 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:35.386 READ DMA EXT
Error 8248 occurred at disk power-on lifetime: 146 hours (6 days + 2 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 e8 1c aa 00 Error: UNC 8 sectors at LBA = 0x00aa1ce8 = 11148520
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 03 08 e8 1c aa e0 00 3d+05:56:48.901 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:44.397 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:39.897 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:35.386 READ DMA EXT
25 03 08 e8 1c aa e0 00 3d+05:56:30.880 READ DMA EXT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 90% 271 91251656
# 2 Extended offline Aborted by host 90% 271 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
答え1
パラメータ値は 100 に正規化され、それより低いほど悪い状態となり、指定されたしきい値を下回ると不合格としてフラグが立てられます。
生の読み取りエラー率が非常に高く、ハードディスクはこの目的のためにすべての予備ブロックをすでに再割り当てしています。
つまり、何らかの理由でディスクが故障しているということです。まだすべてを読み取ることはできるかもしれませんが (おそらくショップの人がテストした内容でしょう)、長くは続かないかもしれません。
手遅れになる前にできるだけ早くバックアップを取り、新しいディスクを入手してください。
編集
バックアップの場合、ドライブを読み取り専用でマウントするようにしてください。スーパーブロックはマウント中にマークされ、ドライブがスーパーブロックを書き込むことができず、割り当てようとしたときに割り当て可能なスペアがなくなると、問題が発生します。これにより、前述の「奇妙なマウント エラー」が発生する可能性があります。
(はい、すでにバックアップを作成していると読みましたが、将来他の誰かがこれを読む可能性があります)。