我正在使用 Tufte 書籍模板 - 並且無法弄清楚如何更改頁碼，使它們位於底部中心（而不是頂部外邊緣）。
（我正在使用的通用模板https://www.overleaf.com/10222634shztyfpxyhvn#/37826845/）
我找不到它甚至被編碼為頂部外邊緣的位置：|
答案1
除非您知道自己在做什麼，否則最好不要嘗試修改模板，因為模板中的命令對於非程式設計師來說太複雜了。您仍然可以使用 package.json 自訂頁首、頁尾和頁碼fancyhdr。\fancyhead{}在序言中使用清除標頭，然後根據需要重新定義它們。然後使用\fancyfoot[LE, RO]{ \thepage }將頁碼移至底部。這裡，LE, RO指的是左偶數和右奇數，這意味著對於偶數頁，編號將在左側，而對於奇數頁，編號將在右側。這是一種幾乎普遍的頁碼做法。
範例的完整程式碼如下所示：
\documentclass[twoside]{tufte-book}
\usepackage{fancyhdr}
\pagestyle{fancy} % allows for more advanced header and footer formats
% Customizations
\renewcommand{\chaptermark}[1]{ \markboth{#1}{} } % customize chapter name here
\renewcommand{\chaptername}{Chapter}
\renewcommand{\sectionmark}[1]{ \markright{#1} } % customize section name here
% Define headers
\fancypagestyle{mainmatter}{
% Header and footer lines
\renewcommand{\headrulewidth}{0.5 pt}
\renewcommand{\footrulewidth}{0 pt}
% Headers
\fancyhead{} % clear header field
\fancyhead[RO]{ \textbf{ \chaptername\ \thechapter:\ \leftmark } } % customize chapter name header here
\fancyhead[LE]{ \hspace{4mm} \thesection \textbf{ \rightmark } } % customize section name header here
% Foot
\fancyfoot{} % clear foot fields
\fancyfoot[LE, RO]{ \thepage } % here is where the page position is defined
}
\begin{document}
\title{Development of a Generalized PV Model in MATLAB/Simulink Using Datasheet Values}
\author{Al-Motasem I. Aldaoudeyeh
\thanks{Al-Motasem I. Aldaoudeyeh is with the Department of Electrical and Computer Engineering, North Dakota State University, Fargo, ND, 58102 USA e-mail: [email protected]}
}
\maketitle
\setcounter{chapter}{1}
\pagestyle{mainmatter}
\chapter{Chapter Name}
\section{Introduction}
\label{section:introduction}
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
\section{Numerical Results and Discussion}
\label{sec:results}
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit.
\section{Conclusions}
\label{sec:conclusions}
This paper proposes an improved single-diode modeling approach for PV modules suitable for a broad range of the PV technologies available today, including modules on tandem cell structures. After establishing the model (which has an overall of seven parameters), the paper devises a methodology to estimate its parameters using Standard Test Conditions (STC) data, Nominal Operating Cell Temperature (NOCT) data, and temperature coefficients values as provided in most manufacturers' datasheets. Simulation results and their comparison with a previous work show a very accurate prediction of critical points in the current-voltage characteristics curve. The precise prediction happens for both STC and NOCT conditions and the error in predicting maximum power point lies within $1\%$ limit, and the error in its corresponding voltage and current is almost always within $2\%$ limit. Further, for both maximum power point and open-circuit voltage, the statistical variance around manufacturer measurements due to temperature changes is demonstrated to be low for five various module technologies.
\end{document}